发明名称 SUBSTRATE POSITION DETECTION METHOD
摘要 PURPOSE:To improve position detection accuracy of a mark and to enable prevention of misdetection. CONSTITUTION:A position of an edge of each of a plurality of marks is obtained by using either maximum values KA, KB, KC or minimum values Ka, Kb of data D2 of a differential value of data D1 comprised of an average strength value, and a position of a mark group is obtained by adding or subtracting half a mark width to or from a position of a mark edge group obtained in accordance with a position of each edge of the marks. Thereby, it is possible to detect a position of a mark group surely at high precision even when one edge of a mark is obtuse.
申请公布号 JPH07142381(A) 申请公布日期 1995.06.02
申请号 JP19930314368 申请日期 1993.11.18
申请人 NIKON CORP 发明人 KITANO HIROSHI;KATAMATA YOSHIYUKI;YANAGIHARA MASAMITSU;FUJIMORI NOBUTAKA;SHINOZAKI TADAAKI
分类号 G03F9/00;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F9/00
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