| 摘要 |
<p>PURPOSE:To measure a voltage with high sensitivity by disposing a plurality of transparent opposing electrodes on the outside of a reflector such that a voltage to be measured can be superposed onto an external DC voltage for one transparent electrode whereas only an external DC power supply can be applied onto the other transparent electrode with respect to an incident light. CONSTITUTION:A dielectric multilayer film is deposited on the light entering/leaving surface of a substrate 10 composed of an anisotropic crystal exhibiting primary electro- optic effect, for example, thus producing a reflector 8. Transparent opposing electrodes 9a, 9b are disposed on the outside of the reflector 8 and interconnected by means of a lead wire 14 such that a voltage to be measured can be superposed on an external DC voltage at the electrode 9a whereas only the external DC power supply can be applied at the electrode 9n for a double beam incident light. The light emitted from a semiconductor laser passes through transmission optical fibers 3a, 3b and a demultiplexer 1 to a directional coupler 4 where it is split equally and a part passes through a condensing rod lens 7 to produce a parallel light. A voltage to be measured is superposed on the external DC voltage and applied to the electrode 9a whereas only the external power supply is applied to the electrode 9b and an electric output from a detector 2d, which is proportional to the voltage to be measured, is measured.</p> |
