发明名称 SCANNING NEAR-FIELD OPTICAL MICROSCOPE
摘要 <p>PURPOSE: To provide a scanning close field optical microscope of a type of transversely scanning a surface of an object sample by radiating or receiving a light beam having a diameter ofλ/20 at its maximum by a sharply pointed probe tip. CONSTITUTION: The light which is reflected by a sample 11 and/or passes through the sample 11 is detected by a detector 16, and is also processed by a computer 24. Since a distance between a probe tip 13 to radiate the light and the sample 11 of an inspection object is similarlyλ/20, a surface of the sample 11 exists in a range of a close field of the probe tip 13. In this optical microscope, a gap between the probe tip 13 and the sample 11 is filled with a highly opaque liquid having a large negative dielectric constantεso that an infiltrating depth zo of a light wave on which this intensity is defined as a distance reducing to l/e is attenuated to a degree less than 100nm inside of the liquid in the intensity of the light wave radiated or received by the probe tip 13.</p>
申请公布号 JPH07140155(A) 申请公布日期 1995.06.02
申请号 JP19930207946 申请日期 1993.08.23
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 POORU URUFUGANGU DEIETERU;KUURUJIYON DANIERU
分类号 G01B11/30;G01N37/00;G01Q30/12;G01Q60/18;G01Q60/20;G01Q60/22;G02B21/00;G11B7/12;(IPC1-7):G01N37/00 主分类号 G01B11/30
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