发明名称 Verfahren und Vorrichtung zum Einstellen von Aufzeichnungsparametern.
摘要 <p>In the method and the device disclosed herein at least one record-carrier-dependent parameter (Is), which influences the quality of the recorded information pattern (58, 59), is adjusted. In determining the optimum setting of the parameters (Is) a calibration area (21) is selected from a number of predetermined calibration areas (21a,..., 21d). The selected calibration area (21) is provided with test patterns for different settings of the parameter. On the basis of the test patterns thus formed the optimum setting of the parameters is determined in accordance with a predetermined criterion. The parameters are adjusted in accordance with said optimum setting during the recording of the information patterns (58, 59). Each time that an optimum setting is determined an auxiliary pattern is formed in an auxiliary area (22) assigned to the calibration area (21), which auxiliary pattern indicates that test patterns are present in the associated calibration area. Each time that the optimum setting is determined the test area to be used is selected on the basis of the auxiliary patterns formed in the auxiliary areas (22a,..., 22d).</p>
申请公布号 DE69014435(T2) 申请公布日期 1995.06.01
申请号 DE1990614435T 申请日期 1990.06.18
申请人 PHILIPS ELECTRONICS N.V., EINDHOVEN, NL 发明人 BAKX, JOHANNES LEOPOLDUS, NL-5656 AA EINDHOVEN, NL
分类号 G06F3/06;G11B7/00;G11B7/0045;G11B7/013;G11B7/126;G11B20/12;G11B27/19;G11B27/24;G11B27/30;G11B27/32;G11B27/36;(IPC1-7):G11B7/007;G11B7/125 主分类号 G06F3/06
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