发明名称 Halbleitervorrichtung in Druckverbindungsausführung und Verfahren zu deren Herstellung
摘要 In order to obtain a pressure-connection type semiconductor device while preventing misregistration of a semiconductor base substrate and a thermal compensator with no penetration of an insulating/holding material and a method suitable for fabricating this device, concentric first and second steps (31c, 31a) are provided on an upper major surface of a first thermal compensator (31) from its outer periphery toward the center. A corner groove (3b) is provided along the overall periphery of an inner comer of the first step (31c), in the form of a ring. Since no insulating/holding material is provided in a contact surface between the semiconductor the substrate and the thermal compensator, the semiconductor base substrate and the thermal compensator are maintained in excellent electrical contact while no local stress is applied to the semiconductor substrate when the same is brought into pressure contact with the thermal compensator.
申请公布号 DE4442295(A1) 申请公布日期 1995.06.01
申请号 DE19944442295 申请日期 1994.11.28
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 NAKASHIMA, NOBUHISA, FUKUOKA, JP;SAKAMOTO, TOKUMITSU, FUKUOKA, JP;KONISHI, YUZURU, FUKUOKA, JP
分类号 H01L29/74;H01L21/52;H01L23/051;H01L23/31;(IPC1-7):H01L23/051;H01L23/28;H01L23/18;H01L23/485 主分类号 H01L29/74
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