发明名称 Non-fully-decoded test address generator
摘要 An address count which increases up to, or decreases down from, a user-selected value is generated by a non-fully-decoded address generator (10) which is configured of a plurality of interconnected, sequentially-actuated of bit generators (12'1-12'k), each generating a separate one of the bits of the address count. Each of the bit generators is presettable to at least one logic state, with at least one bit generator being presettable to a separate one of two logic states. A control circuit (30' presets the bit generators in accordance to the user-selected initial value so that when the bit generators are sequentially actuated, their collective count runs up to, or down from, the seed value.
申请公布号 US5420870(A) 申请公布日期 1995.05.30
申请号 US19940322462 申请日期 1994.10.11
申请人 AT&T CORP. 发明人 KIM, ILYOUNG
分类号 H03K23/00;G01R31/3181;G11C8/04;G11C29/20;(IPC1-7):G11C29/00 主分类号 H03K23/00
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