| 摘要 |
A wavelength meter for measuring the wavelength of laser light includes a diffraction element for diffracting the light and a glass plate interferometer in light communication with the diffraction element for generating a sinusoidally-shaped interference fringe pattern. The interference fringe pattern is detected by a CCD array which sends a signal representative of the fringe pattern to a computer. The computer filters and analyzes the signal, and corrects the signal for temperature-induced changes in the optical path of the laser light beam. The computer compares the signal with a prestored signal representing a predetermined fringe pattern using a least-squares fit analysis, and from this analysis determines the wavelength of the laser light.
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