发明名称 Method for interconnecting layers in a semiconductor device
摘要 A method for interconnecting layers in a semiconductor device is disclosed. The device includes a lower conductive layer formed by capping a second conductive layer on a first conductive layer, a contact window formed in an inter-insulating layer on the lower conductive layer, and an upper conductive layer connected to the lower conductive layer through the contact window. The contact window is formed by removing a portion of the inter-insulating layer where the contact will be formed using a first etching gas, and removing a portion of the second conductive layer where the contact will be formed using a second etching gas. The contact resistance becomes uniform by preventing the formation of a non-volatile mixture in the contact window, and the reliability of the device is improved by planarizing the surface of the lower conductive layer.
申请公布号 GB2260643(B) 申请公布日期 1995.05.24
申请号 GB19910024550 申请日期 1991.11.20
申请人 * SAMSUNG ELECTRONICS CO LIMITED 发明人 JIN-HONG * KIM;CHANG-LYONG * SONG
分类号 H01L21/302;H01L21/3065;H01L21/311;H01L21/3213;H01L21/768;H01L23/522;(IPC1-7):H01L23/535 主分类号 H01L21/302
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