发明名称 DRAM CELL ASSEMBLY.
摘要 PCT No. PCT/DE93/00542 Sec. 371 Date Feb. 10, 1995 Sec. 102(e) Date Feb. 10, 1995 PCT Filed Jun. 23, 1993 PCT Pub. No. WO94/03898 PCT Pub. Date Feb. 17, 1994In a DRAM cell arrangement, two memory cells which include an MOS transistor and a memory element are constructed in each case as a transistor pair (10) whose source areas are connected to one another and to a bitline (11). The MOS transistors have a linear arrangement of the drain area, the gate electrode and the source area which is aligned in the direction of the bitlines (11) and which is arranged essentially below a bitline (11). Adjoining the drain area in each case is a terminal area (13) which is arranged to the side of associated bitlines (11) and via which a cell contact to the memory element is formed. The cell arrangement is particularly suitable for buried-bitline-stacked-capacitor (BBSTC) DRAM cells.
申请公布号 EP0654166(A1) 申请公布日期 1995.05.24
申请号 EP19930912609 申请日期 1993.06.23
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 ROESNER, WOLFGANG
分类号 H01L21/8242;G11C11/401;H01L27/108;(IPC1-7):G11C11/00 主分类号 H01L21/8242
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