发明名称 |
TFT AND ITS MAKING METHOD |
摘要 |
The method is for manufacturing a bottom gate type thin film transistor having an etch-stopper layer. The method comprises steps; (A) forming a gate electrode pattern with certain thickness by vaporizing a metal layer on a glass; (B) forming a gate isolation layer, a semi-conductor layer, and a first metal layer by vaporizing process; (C) patterning a first metal layer using a photo-etching method; (D) forming an ohmic layer and removing a semi-conductor layer and outer side of an ohmic layer using reactive ion etching method to isolate devices; (E) patterning a source and a drain electrode by vaporizing a second metal and removing an ohmic layer between a first and a second metal layer; and (F) forming a protective layer.
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申请公布号 |
KR950005483(B1) |
申请公布日期 |
1995.05.24 |
申请号 |
KR19920008944 |
申请日期 |
1992.05.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, NAM - DUK |
分类号 |
H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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