发明名称 |
METAL LAYER PATTERN SEPATATION METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
The method includes the steps of applying a first photoresist layer, an insulating layer and a second photoresist layer on a metal layer to be isolated into a number of regions, masking a mask having an isolation pattern and a dummy pattern (33) on the second photoresist layer, and exposing and etching the metal layer to pattern the metal layer (38), thereby forming isolation regions (35,36) between patterns into the metal layer. the method uses a dummy pattern to minimise the polymer (37) generation upon etching of the first photoresist layer.
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申请公布号 |
KR950005439(B1) |
申请公布日期 |
1995.05.24 |
申请号 |
KR19920009077 |
申请日期 |
1992.05.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG, JAE - SONG;HAN, MIN - SOK |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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