发明名称 Process for formation of memory cell where capacitor is disposed below a transistor
摘要 A semiconductor memory cell and a process for formation thereof is disclosed. A capacitor is disposed below a transistor, so that a DRAM cell that may be suitable for a high density semiconductor device is produced. A semiconductor device according to the present invention includes: a buried capacitor consisting of a storage electrode, a dielectric layer and a plate electrode formed on a substrate in a planar form; and a transistor formed above the capacitor, a source/drain region of the transistor being connected to the storage electrode of the capacitor.
申请公布号 US5418177(A) 申请公布日期 1995.05.23
申请号 US19940207769 申请日期 1994.03.07
申请人 GOLDSTAR ELECTRON CO., LTD. 发明人 CHOI, JONG M.
分类号 H01L27/10;H01L21/8242;H01L27/108;H01L27/12;(IPC1-7):H01L21/70;H01L27/00 主分类号 H01L27/10
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