发明名称 |
THIN FILM SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS FABRICATION |
摘要 |
<p>PURPOSE:To allow the modification of the width of high resistance region depending on the required characteristics and reliability by connecting the source-drain region of at least one thin film transistor with a wiring formed of same film as other gate electrode through a metal wiring formed on an layer insulator. CONSTITUTION:A layer insulator 117 and the anode oxide 112 of a wiring 108 are etched to make a contact hole 119 at the source-drain of a TFT. Multilayer wirings 120-125 of titanium nitride and aluminium are then formed wherein the wiring 124 is connected with a pixel electrode 118 and the wiring 125 is connected with gate electrodes 106, 107. Each of TFTs 126, 127 formed on a same substrate has an active layer of crystalline silicon and suitable for high speed operation because of its narrow high resistance region whereas a TFT 128 has an active layer of amorphous silicon and suitable for low leak current operation because of its wide high resistance region.</p> |
申请公布号 |
JPH07135323(A) |
申请公布日期 |
1995.05.23 |
申请号 |
JP19930285990 |
申请日期 |
1993.10.20 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
KONUMA TOSHIMITSU;HIROKI MASAAKI;CHIYOU KOUYUU;YAMAMOTO MUTSUO;TAKEMURA YASUHIKO |
分类号 |
G02F1/136;G02F1/1368;H01L21/20;H01L21/28;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/78;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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