发明名称 Radiometric thickness measurement gage
摘要 Radiometric gage for contactless measurement of the surface density or the thickness of a flat product, includes: an X-radiation emitter, whose tube, is directed toward the flat product an X-radiation receiver, whose detector is disposed in order to receive X-radiation scattered or transmitted in attenuated form through said flat product, said receiver delivering a measurement signal a member for processing the measurement signal, in order to obtain information representing the surface density or the thickness of the flat product The anticathode of the tube is made of a material with atomic number as high as possible, preferably greater than 70, which is a good conductor of heat and has a high melting point. A member for adjusting the voltage (V) between the cathode and the anticathode is designed to operate in a predetermined range of relatively low voltages, in order to obtain, in conjunction with the anticathode, an X-ray emission spectrum essentially limited to continuous bremmstrahlung whose maximum energy is fixed by the value of the voltage (V) between cathode and anticathode.
申请公布号 US5418830(A) 申请公布日期 1995.05.23
申请号 US19930057810 申请日期 1993.05.07
申请人 SCAN-TECH S.A. 发明人 FLORENT, JEAN-JACQUES
分类号 G01B15/02;H01J35/08;(IPC1-7):G01B15/02 主分类号 G01B15/02
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