发明名称 Apparatus and method of checking the thickness and uniformity of a coating deposited on an elongated insulating body using a condenser sensor as part of a resonant electrical circuit
摘要 This invention concerns an apparatus for checking the thickness and uniformity of a coating made of conducting material deposited on an elongated insulating body, this apparatus comprising: a sensor sensitive to the presence of the elongated body and forming part of an electrical circuit powered by a power supply voltage (24), measurement instruments (25) to measure an electrical quantity that is a function of the thickness of the conducting coating, at the output of the circuit equipment for processing the electrical quantity to deduce the thickness of the conducting coating, wherein the sensor consists of a condenser (10) containing two plates separated from each other by an air gap containing a dielectric material, this condenser being adapted to enable the elongated body to pass through the air gap.
申请公布号 US5418467(A) 申请公布日期 1995.05.23
申请号 US19930082446 申请日期 1993.06.25
申请人 ALCATEL FIBRES OPTIQUES 发明人 FLOCH, BERNARD;MACKENZIE, PATRICK
分类号 B29C47/92;G01B7/06;G01R27/26;G05D5/02;(IPC1-7):G01R27/26 主分类号 B29C47/92
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