发明名称 INTERATOMIC FORCE MICROSCOPE AND SAMPLE OBSERVATION METHOD IN INTERATOMIC FORCE MICROSCOPE
摘要 PURPOSE:To measure the friction force in one direction, show the internal structure which can be deformed in a specific direction easily as an image, and evaluate viscoelastic behavior. CONSTITUTION:An interatomic force microscope 1 is provided with a vibration device for operating a relative vibration in vertical direction and a relative vibration in horizontal direction to a sample 8 and a probe 4 in superposition. A vibration in vertical vibration and that in horizontal vibration relative to the sample 8 and the probe 4 are operated in superposition to generate a vibration where the trace of the relative motion is in straight line or in annular shape to the probe 4 and the sample 8 or to generate a vibration in relative motion in side direction while the probe 4 is pressed into the sample 8, the response in the probe 4 is observed, and the friction coefficient and the inclination in specific direction of the sample 8 and the images of the elasticity rate in a specific direction, the internal defect, the foreign matter, and the structure body of the sample 8 are taken up.
申请公布号 JPH07134023(A) 申请公布日期 1995.05.23
申请号 JP19930303518 申请日期 1993.11.09
申请人 AGENCY OF IND SCIENCE & TECHNOL 发明人 YAMANAKA ICHIJI
分类号 G01B21/30;G01B5/28;G01N37/00;G01Q10/06;G01Q30/04;G01Q60/24;G01Q60/26;G01Q60/28;G01Q60/32;G01Q60/34;H01J37/28;(IPC1-7):G01B21/30 主分类号 G01B21/30
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