发明名称 DEVICE FOR MEASURING MAGNIFICATION/ANGLE OF PATTERN
摘要 PURPOSE:To automatically measure the magnification and angle of a pattern by calculating the contour distances from the center of gravity of the pattern to contour pixels and plotting the contour distances at respective angle positions to form a graph and calculating the dispersion of a contour distance ratio. CONSTITUTION:The pattern (a) on a printing manuscript A and the pattern (b) on layout specifying paper B are inputted to a computer 100. Edge detection processing is performed with respect to the pattern (a) and the patterns (a), (b) are subjected to binarization processing to become a line image consisting of black and white pixels. The center of gravity of line image data is set as an end, point to define the half straight line Ltheta arranged at an arbitrary angle position theta and the black pixel present at the remotest distance from the center of gravity on the line Ltheta is determined as a contour pixel Ptheta. A contour line is constituted by the aggregate of pixels P, over 360'. The contour line is corrected in fault by smoothing processing and the distance rtheta of the pixel Ptheta and the center of gravity is calculated over 360 deg.. A graph taking positions theta on horizontal axes and the contour distances ratheta, rbtheta of the patterns (a), (b) on vertical axes are formed. The ratio rbtheta/rtheta at the position theta becomes the relative magnification to be calculated of both patterns and the phase distance between both graphs becomes a relative angle of rotation.
申请公布号 JPH07134014(A) 申请公布日期 1995.05.23
申请号 JP19930304653 申请日期 1993.11.10
申请人 DAINIPPON PRINTING CO LTD 发明人 ARAI TAKASHI;KUDO YOSHIAKI;TAKAGI MIKIO
分类号 B41F33/14;G01B11/24;G01B11/26;G03F1/00 主分类号 B41F33/14
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