发明名称 THICKNESS DIRECTIONAL MODULUS OF RIGIDITY MEASURING METHOD AND ITS SYSTEM
摘要 The method continuously gives the stress to the testpiece by rotating the screw shaft. The apparatus comprises a mounting plate for mounting the sample cell or the testpiece; a probe for compressing the cell load in touch with the testpiece; LVDT (linear variable differential transformer) connected with an amplifier for transforming the displacement to the voltage; a frame for fixing the cell load on the lower side and fixing the load cell on the upper side; a movable means for giving the vertical stress on the upper side of the load cell.
申请公布号 KR950005090(B1) 申请公布日期 1995.05.18
申请号 KR19910019453 申请日期 1991.11.01
申请人 KOLON IND. INC. 发明人 KIM, JIN - SA
分类号 G01N3/00;(IPC1-7):G01N3/00 主分类号 G01N3/00
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