发明名称 CVD reactor for improved film thickness uniformity deposition.
摘要 A chemical vapor deposition reactor (50) comprises in combination a nozzle (52) and means (54) for equalizing a reactant chemistry and a flux of reactants. The nozzle is disposed within a chamber (15) opposite a susceptor (14) upon which a substrate (56) is supported during chemical deposition of a film upon a surface of the substrate from a reactant gas released into the chamber by the nozzle. The nozzle comprises an inlet port (58) for receiving the reactant gas from a gas supply and an outlet port (60) for releasing the reactant gas therethrough. The equalizing means substantially equalizes a reactant chemistry and a flux of reactants uniformly across the surface of the substrate. <IMAGE>
申请公布号 EP0653500(A1) 申请公布日期 1995.05.17
申请号 EP19940480112 申请日期 1994.10.26
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BARBEE, STEVEN GEORGE;CONTI, RICHARD ANTHONY;CHAPPLE-SOKOL, JONATHAN DANIEL;KOTECKI, DAVID EDWARD;WILSON, DONALD LESLIE;ZUHOSKI, STEVEN PAUL;CHOW WONG, JUSTIN WAI
分类号 C23C16/44;C23C16/455;C30B25/14;H01L21/205 主分类号 C23C16/44
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