CVD reactor for improved film thickness uniformity deposition.
摘要
A chemical vapor deposition reactor (50) comprises in combination a nozzle (52) and means (54) for equalizing a reactant chemistry and a flux of reactants. The nozzle is disposed within a chamber (15) opposite a susceptor (14) upon which a substrate (56) is supported during chemical deposition of a film upon a surface of the substrate from a reactant gas released into the chamber by the nozzle. The nozzle comprises an inlet port (58) for receiving the reactant gas from a gas supply and an outlet port (60) for releasing the reactant gas therethrough. The equalizing means substantially equalizes a reactant chemistry and a flux of reactants uniformly across the surface of the substrate. <IMAGE>
申请公布号
EP0653500(A1)
申请公布日期
1995.05.17
申请号
EP19940480112
申请日期
1994.10.26
申请人
INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人
BARBEE, STEVEN GEORGE;CONTI, RICHARD ANTHONY;CHAPPLE-SOKOL, JONATHAN DANIEL;KOTECKI, DAVID EDWARD;WILSON, DONALD LESLIE;ZUHOSKI, STEVEN PAUL;CHOW WONG, JUSTIN WAI