发明名称 |
Sample stage for scanning probe microscope head. |
摘要 |
There is disclosed a sample stage of a scanning probe microscope head capable of changing the direction of a sample plane stably over a wide range in a simple operation. Fixtures 310 and 320 fix both ends of an outer flexible tube 220 of a flexible shaft 200. A displacement lead-in portion 400 displaces one end of an inner flexible tube 210 of the flexible shaft 200 relative to the outer flexible tube 220, and a displacement lead-out portion 500 and a coupling portion 600 transmit the displacement led in the inner flexible tube 210 of the flexible shaft 200 to a sample carrier portion 700 to turn the sample carrier portion 700 about a turn axis, thereby getting a sample plane to change direction. <IMAGE> |
申请公布号 |
EP0653628(A1) |
申请公布日期 |
1995.05.17 |
申请号 |
EP19940116075 |
申请日期 |
1994.10.12 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA;RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION |
发明人 |
NISHIOKA, TADASHI, C/O RYODEN SEMICONDUCTOR SYSTEM;YASUE, TAKAO, C/O MITSUBISHI DENKI K. K. |
分类号 |
G01B21/30;G01N27/00;G01Q10/02;G01Q30/20;G01Q60/10;G01Q70/02;G01Q70/16;H01J37/20 |
主分类号 |
G01B21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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