发明名称 FABRICATION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To increase the capacitance by forming a lower layer electrode having a plane rougher than a silicon film having large surface area thereby increasing the area of electrode. CONSTITUTION:The method for fabricating a semiconductor device comprises a step for depositing a first silicon doped heavily with impurities to form the lower layer electrode 8 for capacitor, a step for depositing a lightly doped second silicon 9 having larger surface area thereon, a step for removing the second silicon 9 having larger area by etching to roughen the surface of the lower layer electrode 8, and a step for forming an upper layer electrode 12 on the lower layer electrode 8 through capacitive insulation films 10, 11.
申请公布号 JPH07122652(A) 申请公布日期 1995.05.12
申请号 JP19930270826 申请日期 1993.10.28
申请人 SANYO ELECTRIC CO LTD 发明人 SAIDA ATSUSHI
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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