发明名称 FILM FORMATION
摘要 PURPOSE:To obtain a silicon oxide film at a large film-forming speed by retaining a number of bodies to be treated at a retention tool with a space and while they are overlapped and at the same time by supplying monosilane gas and nitrous oxide gas into a reaction pipe at a large flow rate. CONSTITUTION:A heating furnace 2 is placed on a base plate 20 and is constituted by providing a heater 22 on the inner-periphery surface of a heat-insulating layer 21. In a wafer boat 5, an annular placement stand is laid out in parallel with a specific spacing between ceiling and bottom plates, a reverse L-shaped supporting member is provided on the upper surface and a wafer W is placed on the supporting member. First, an atmosphere to be treated within a reaction pipe 3 is heated so that temperature reaches 800 deg.C and a wafer boat 5 retaining the wafer W is carried into the reaction pipe 3 from a lower opening using an elevation stand 43. Then, the flow rate of monosilane gas is set to 50-100cc per minute and the flow rate ratio between monosilane gas and nitrous oxide gas is set to 1:40-1:60 and the pressure within the reaction pipe is set to 0.9-1.5Torr for forming film.
申请公布号 JPH07122504(A) 申请公布日期 1995.05.12
申请号 JP19930287542 申请日期 1993.10.22
申请人 TOKYO ELECTRON LTD;TOKYO ELECTRON TOHOKU LTD 发明人 TAGO KENJI
分类号 H01L21/22;H01L21/205;H01L21/31;(IPC1-7):H01L21/205 主分类号 H01L21/22
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