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发明名称
TEST METHOD FOR SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE HAVING TEST ELECTRODE PAD
摘要
申请公布号
JPH07122603(A)
申请公布日期
1995.05.12
申请号
JP19930292604
申请日期
1993.10.27
申请人
NIPPON STEEL CORP
发明人
ANZAI KENJI
分类号
H01L21/66;(IPC1-7):H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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