| 摘要 |
A test method whereby an electric pulse signal is supplied to a pin (16) of an integrated circuit (8) on an electronic circuit board (6), and, by means of an electrode (27) facing the casing (11) of the integrated circuit (8), the electric field (E) produced inside the casing (11) by the pulse signal is detected. In the event the pin (16) or the bonding wire (18) is interrupted electrically, a very weak electric field (E) is detected, and a faulty connection signal generated. <IMAGE> |
