Fuse blow circuit.

摘要

A chip can be provide with circuits to electrically read, blow and latch fuses. The circuit allows use of existing I/O pads used for other functions on a chip to drastically reduce the number of I/O required to blow fuses. The circuits also share critical high current carrying lines with no impact on fuse functionality and device reliability. By offering of complex fuse operations such as electrical override, even after they had been blown, essential for product screening and product diagnostics. The circuit provides a fuse blow circuit fed by a fuse sense circuit and fuse lactch circuit. Stored addresses in an address buffer addresses the fuses with two sets of inputs: one providing electrical override and/or fuse blow information; and the second one, normal fuse status. Fuse integrity before and after blow is maximized with a dual voltage source drive and low current sensing.