发明名称 Method of forming a pattern on a substrate having a step change in height
摘要 A method for forming a pattern improves a profile of a resist pattern. The method forms a photoresist layer on a substrate having a step, and exposes the photoresist layer using a first mask. Then, thick portions of the photoresist layer are exposed using a second mask, and the entire resist is developed. The second mask provides an additional increment of energy to thick regions so that no inadequately exposed resist material will remain near the step.
申请公布号 US5413898(A) 申请公布日期 1995.05.09
申请号 US19930164885 申请日期 1993.12.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HAK;HAN, WOO-SUNG
分类号 G03F7/26;G03F7/20;H01L21/027;(IPC1-7):G03C5/00 主分类号 G03F7/26
代理机构 代理人
主权项
地址