| 摘要 |
An automatic transistor checking method is provided, whereby an unknown, bipolar transistor may be typed, pinned and checked for forward DC gain, Hfe. The method is suitable for portable instruments, because the method uses little battery current to perform the Hfe measurement. The method automatically determines transistor type (NPN or PNP) and pinout, making it suitable for quick checking of batches of unknown devices.
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