发明名称 Grating fabrication using electron beam lithography
摘要 A technique is disclosed for utilizing direct-write electron-beam photolithography and holographic optical exposure to form gratings in optoelectronic structures. The direct-write e-beam process is used to form rectangular grating teeth in a mask substrate, where the mask is then used as a phase mask to transfer the pattern to the optoelectronic device. Advantageously, the utilization of a direct write e-beam technique to form the grating pattern on the photomask allows for the formation of any desired number and location of abrupt phase shifts, multiple grating pitches, alignment fiducials, and any other desired features. Therefore, a single exposure of the direct write e-beam mask allows for a plurality of different grating patterns to be simultaneously printed.
申请公布号 US5413884(A) 申请公布日期 1995.05.09
申请号 US19920989690 申请日期 1992.12.14
申请人 AMERICAN TELEPHONE AND TELEGRAPH COMPANY 发明人 KOCH, THOMAS L.;OSTERMAYER, JR., FREDERICK W.;TENNANT, DONALD M.;VERDIELL, JEAN-MARC
分类号 G02B5/18;G02B6/12;G02B6/122;G02B6/124;G03F7/00;G03F7/20;(IPC1-7):G03F9/00 主分类号 G02B5/18
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