发明名称 |
Integrated circuit testing device |
摘要 |
An integrated circuit testing device, including a small test signal generator for generating a small test signal having a small amplitude corresponding to a test signal supplied to an input terminal of a target integrated circuit to be tested; a test signal supply circuit for amplifying the small test signal generated from the small test signal generator to obtain the test signal having a predetermined power and timing, and for supplying the test signal to the input terminal of the target integrated circuit to be tested; and a controller for setting a rise time of the test signal and a fall time of the test signal at a predetermined time by adjusting the amount of power of the test signal supplied from the test signal supply circuit.
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申请公布号 |
US5412258(A) |
申请公布日期 |
1995.05.02 |
申请号 |
US19910796585 |
申请日期 |
1991.11.22 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
OGAWA, YOSHIKAZU;OHASHI, KAZUHIKO |
分类号 |
G01R31/28;G01R31/319;H03K5/01;(IPC1-7):H03K3/01;H03K5/13;H03L5/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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