发明名称 Phase shifting mask structure with absorbing/attenuating sidewalls for improved imaging
摘要 A phase shifting mask has phase shifters in which the sidewalls of the shifters are coated with a light absorbing or attenuating material. The light absorption at the sidewalls reduces the edges scattering and improves the resolution by obtaining similar transmission profiles from phase shifted and unshifted regions of the PSM.
申请公布号 US5411824(A) 申请公布日期 1995.05.02
申请号 US19940257424 申请日期 1994.06.09
申请人 SEMATECH, INC. 发明人 VASUDEV, PRAHALAD K.;LOW, KAH K.
分类号 G03F1/00;(IPC1-7):G03F9/00 主分类号 G03F1/00
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