发明名称 Method of forming a planar thin film transistor
摘要 The disclosure includes preferred semiconductor transistor devices utilizing thin film transistors, as well as preferred methods of forming such devices. Specifically, a bottom thin film transistor gate is formed having a top surface. An insulating filler is provided adjacent the thin film transistor gate to an elevation at least as high as the thin film transistor gate top surface, and subsequently levelled to provide generally planar insulating surfaces adjacent the thin film transistor gate. The planar insulating surfaces are substantially coplanar with the thin film transistor gate top surface. A planar semiconductor thin film is then formed over the thin film transistor gate and over the adjacent planar insulating surfaces. The thin film is doped to form source and drain regions of a thin film transistor which is bottom gated by the thin film transistor gate.
申请公布号 US5411909(A) 申请公布日期 1995.05.02
申请号 US19930082401 申请日期 1993.06.23
申请人 MICRON TECHNOLOGY, INC. 发明人 MANNING, MONTE;DENNISON, CHARLES
分类号 H01L21/8244;H01L27/11;(IPC1-7):H01L21/70;H01L27/00 主分类号 H01L21/8244
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