发明名称 Process of making a capacitor in a semiconductor memory device
摘要 A process of making a capacitor in a semiconductor memory device provides photomasking processes which are reduced as all the stacked-disposable layers and the storage electrode node contact are patterned at the same time, and also an efficient area of the storage electrode node of a capacitor is maximized, and the process is simplified due to the formation of indented (fin-shaped) area by eliminating selectively the disposable layers which is stacked more than two time. The present invention provides a simple and time-saving process of making a capacitor in a semiconductor memory cell device.
申请公布号 US5409856(A) 申请公布日期 1995.04.25
申请号 US19930131219 申请日期 1993.10.06
申请人 GOLDSTAR ELECTRON CO., LTD. 发明人 JUN, YOUNG-KWON
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;(IPC1-7):H01L21/70;H01L27/00 主分类号 H01L27/04
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