发明名称 |
Process of making a capacitor in a semiconductor memory device |
摘要 |
A process of making a capacitor in a semiconductor memory device provides photomasking processes which are reduced as all the stacked-disposable layers and the storage electrode node contact are patterned at the same time, and also an efficient area of the storage electrode node of a capacitor is maximized, and the process is simplified due to the formation of indented (fin-shaped) area by eliminating selectively the disposable layers which is stacked more than two time. The present invention provides a simple and time-saving process of making a capacitor in a semiconductor memory cell device.
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申请公布号 |
US5409856(A) |
申请公布日期 |
1995.04.25 |
申请号 |
US19930131219 |
申请日期 |
1993.10.06 |
申请人 |
GOLDSTAR ELECTRON CO., LTD. |
发明人 |
JUN, YOUNG-KWON |
分类号 |
H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;(IPC1-7):H01L21/70;H01L27/00 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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