发明名称 Circuit device having a test function for checking circuit operation
摘要 A circuit device including a DC characteristic test circuit is arranged to have a reset signal supplied via a reset signal input terminal for resetting a testee circuit to be subjected to a DC characteristic test; and to include an output buffer circuit which receives a predetermined output signal of the testee circuit and the reset signal supplied from the reset signal input terminal. The arrangement enables the DC characteristic test to be quickly carried out on the circuit device at a low cost and without increasing the number of terminals required for the test.
申请公布号 US5410247(A) 申请公布日期 1995.04.25
申请号 US19930011117 申请日期 1993.01.29
申请人 CANON KABUSHIKI KAISHA 发明人 ISHIZUKA, KEIJI
分类号 G01R31/26;G01R31/28;G01R31/3193;H01L27/00;(IPC1-7):G01R31/28 主分类号 G01R31/26
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