发明名称 FORMATION OF PZT THIN FILM
摘要 PURPOSE:To attain a good electric characteristic by depositing a PZT thin film on a high-temp. substrate, etching the surface to remove the Pb-excess layer, keeping the film at a high temp. to re-evaporize Pb and eliminating a Pb-excess region from the vicinity of the PZT thin film surface. CONSTITUTION:A Pb-excess PZT sintered target 26 is used, a substrate 25 is heated to 600-650 deg.C, a gaseous mixture of argon and oxygen is introduced to control the pressure to 0.5-4 Pa, a high-frequency power of 150W is applied on the target 26, and a PZT thin film is deposited on the substrate 25. The thin film is then cooled to room temp., a high-frequency bias is impressed on the substrate 25 to etch the PZT thin film, and the surface layer is removed to a depth of at least about 20nm. Otherwise, the PZT thin film is deposited, a shutter 40 is closed, and the substrate is kept at the same temp. for 20min in the same gas atmosphere while continuing discharge. Consequently, Pb is re-evaporized from the film surface, and a Pb-excess layer is not formed.
申请公布号 JPH07109562(A) 申请公布日期 1995.04.25
申请号 JP19930275956 申请日期 1993.10.08
申请人 ANELVA CORP 发明人 HIRATA KAZUO
分类号 C04B35/49;C01G25/00;C23C14/08;C23C14/58;C23F4/00;H01B3/12 主分类号 C04B35/49
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