发明名称 Process of making silicided contacts for semiconductor devices
摘要 A contact for a semiconductor device is provided by depositing a layer of palladium on a silicon substrate, causing the palladium to react with the substrate for forming palladium silicide, removing unreacted palladium from the substrate, forming doped silicon on the palladium silicide and substrate, causing the silicon to be transported through the palladium silicide for recrystallizing on the substrate for forming epitaxially recrystallized silicon regions on the substrate and lifting the palladium silicide above the epitaxially recrystallized silicon regions for forming a silicided contact therefor, and removing the doped silicon from the substrate.
申请公布号 US5409853(A) 申请公布日期 1995.04.25
申请号 US19940246532 申请日期 1994.05.20
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 YU, ANTHONY J.
分类号 H01L21/28;H01L21/285;H01L21/336;H01L29/45;H01L29/78;(IPC1-7):H01L21/283 主分类号 H01L21/28
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