| 摘要 |
PURPOSE:To automaticaly test a device. CONSTITUTION:In the case of testing the device for executing a series of processings while exchanging data between a first device 5 and a second device 6, test data 7 for which the input/output data of the first device 5 and timer values for indicating the generation point of time of the input/output data gathered from the device of a normal state are time sequentially arrayed are provided and a series of the test data is successively extracted from the front while the first device 5 and the second device 6 are separated. The input data are inputted to the first device 5 after the lapse of the time corresponding to the corresponding timer value when the test data are the input data, the coincidence verification of the data and the verification of the validity of output time based on the timer value are performed with the data outputted next from the first device 5 when the test data are the output data and the first device 5 is tested. |
