发明名称 SEMICONDUCTOR MEMORY AND FABRICATION THEREOF
摘要 PURPOSE:To enhance the integration of semiconductor integrated circuit and to increase yield in the fabrication thereof by eliminating the level difference at the border of memory cell part and peripheral circuit part which causes troubles in the formation of fine pattern. CONSTITUTION:Transistors 9, 12, 13 formed on a semiconductor substrate 1 form a memory cell part A whereas transistors 6, 8 formed on an SOI layer 5 being formed on an insulation film 2 form a peripheral circuit part B. Level difference is eliminated from the peripheral circuit part B by forming the insulation film 2 and the SOI layer 5 having the thicknesses corresponding to those of stacked capacitors 11, 14, 15.
申请公布号 JPH07106434(A) 申请公布日期 1995.04.21
申请号 JP19930249378 申请日期 1993.10.05
申请人 MITSUBISHI ELECTRIC CORP 发明人 KIMURA HIROSHI
分类号 H01L27/10;H01L21/8242;H01L27/105;H01L27/108;H01L29/78;H01L29/786 主分类号 H01L27/10
代理机构 代理人
主权项
地址