发明名称 MEASURING APPARATUS FOR CRYSTAL GRAIN
摘要 PURPOSE:To detect an abnormality with high accuracy irrespective of a fluctuation in a detected sheet thickness by a method wherein the flaw-detection frequency of ultrasonic waves is changed so as to obtain a resonance frequency according to the sheet thickness. CONSTITUTION:A personal computer 32 sets a flaw-detection reference frequency and a reference voltage according to coil information on an input sheet thickness or the like, and it sends them to a peak-frequency detection circuit 34 and a function generator 36. The generator 36 generates an electric signal at a frequency and a reference voltage which are set by a peak frequency detection circuit 34, and ultrasonic waves are incident on a steel plate 10 by the use of transmission probe 22A and they are received by a reception probe 22B. The received ultrasonic waves are input to a gate peak detector 42, and an abnormal particle is detected when the level of an extracted peak voltage is at a prescribed value or lower. At this time, a flaw-detection frequency shift circuit 44 shifts a flaw-detection frequency when an input peak voltage has a shape corresponding to a normal part. Then, the circuit 34 changes the flaw-detection frequency on the basis of the relationship between a sheet thickness (d)[m] and a resonance frequency (f)[Hz] when a sheet-thickness fluctuation width is at DELTAd, it finds a peak frequency at which a sound pressure becomes maximum, and it sends the peak frequency to the generator 36. Thereby, it is possible to obtain the resonance frequency according to the sheet thickness.
申请公布号 JPH07103947(A) 申请公布日期 1995.04.21
申请号 JP19930246828 申请日期 1993.10.01
申请人 KAWASAKI STEEL CORP 发明人 MIYAKE SHUNEI;AIZAWA HITOSHI;ANABUKI YOSHINORI
分类号 G01N29/04;G01N29/00;G01N29/07;G01N29/11;G01N29/12 主分类号 G01N29/04
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