发明名称 PLASMA TREATMENT EQUIPMENT
摘要 <p>PURPOSE:To enable high efficiency plasma treatment by concentrating plasma, when plasma is generated at a low pressure with a high frequency antenna, and treatment is performed by using the plasma. CONSTITUTION:A high frequency antenna 7 constituted of a spiral coil is arranged on the outside of the upper surface of an airtight structure chamber 2, and plasma is generated by forming an electromagnetic field in the chamber 2 by applying a high frequency current to the antenna 7. On the other hand, a focus ring 6 composed of an insulative material like ceramic is arranged on the mounting stand 3 of a wafer W so as to surround the semiconductor wafer W. The ring 6 is so formed that the upper surface becomes higher from the inside to the outside, which is higher than the surface of the wafer W. Thereby the plasma is concentrated and flatness of the lower surface of plasma in the peripheral part of the wafer W is improved.</p>
申请公布号 JPH07106316(A) 申请公布日期 1995.04.21
申请号 JP19930273140 申请日期 1993.10.04
申请人 TOKYO ELECTRON LTD 发明人 ISHII NOBUO
分类号 H05H1/46;C23C16/507;H01L21/203;H01L21/205;H01L21/302;H01L21/3065;H01L21/68;H01L21/683;H01Q9/27;(IPC1-7):H01L21/306 主分类号 H05H1/46
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