发明名称
摘要 PURPOSE:To facilitate manufacture by constituting diffraction grating structure by a superlattice structure region and a non-superlattice structure region formed through the implantation of impurity ions to superlattice structure. CONSTITUTION:A buffer layer 5, a clad layer 6, an active layer 1, an optical leaking-out layer 3 and a superlattice layer 7 are grown on a GaAs substrate crystal 4 through a molecular-beam crystal growth method in succession. Si is implanted to the superlattice layer 7 while keeping regular intervals to shape impurity implanting regions 16, and an impurity is also implanted similarly to regions 17 on both sides while leaving a central diffraction grating to a striped shape. The impurity is implanted in high concentration to a position as a boundary on a substrate to form a high ion-implanting region 12. Consequently, a non-superlattice structure region is shaped, a P-type AlGaAs layer 8 and a P-type GaAs layer 9 are crystal-grown continuously on the non- superlattice structure region under a high vacuum, and lastly a metal is evaporated onto an uppermost layer to form an electrode 13. Accordingly, a fine diffraction grating can be manufactured precisely and easily.
申请公布号 JPH0736461(B2) 申请公布日期 1995.04.19
申请号 JP19850025255 申请日期 1985.02.14
申请人 发明人
分类号 H01L21/265;H01S5/00;H01S5/12;(IPC1-7):H01S3/18 主分类号 H01L21/265
代理机构 代理人
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