| 摘要 |
In a method for testing an electronic circuitry arrangement, first a test signal of predetermined habitus is provided. Next, the arrangement is operated in a predetermined mode. Finally, a result signal of intended habitus is extracted from one or more specific signal outputs of said the arrangement for subsequent evaluation. In particular, an analog parent signal is modulated to a digital bit stream and subsequently the test signal is produced through analog filtering of the digital bit stream. More in particular, the extracting repeatedly discriminates an output wave result signal with successive threshold levels and subsequently realigns successive discrimination bit stream results for at respective instants generating a thermometer signal code. |
