发明名称 Wide range straightness measuring stem using a polarized multiplexed interferometer and centered shift measurement of beam polarization components
摘要 A wide range straightness measuring system of the present invention accurately determines lateral and angular displacement of a probe carriage of a cartesian robot. The system includes a laser aligned with an x-axis rail of the cartesian robot system which generates a laser beam having two polarization components. A pentaprism beamsplitter is disposed on an x-axis carriage aligned with the laser. The beamsplitter orthogonally splits the laser beam into an x-axis reference beam and a y-axis reference beam. An x-axis interferometer receives the x-axis reference beam and determines a relative position value of the probe carriage measured along the x-axis. A y-axis interferometer receives the y-axis reference beam and determines a relative position value for the probe carriage measured along the y-axis. A beam monitor receives a polarized multiplexed output of the y-axis interferometer and monitors the lateral shift of the energy centroids of the beam polarization components. Both lateral and angular displacement values of the x and y-axis reference beams can be obtained by measuring the magnitude of the lateral shift.
申请公布号 US5408318(A) 申请公布日期 1995.04.18
申请号 US19930101226 申请日期 1993.08.02
申请人 NEARFIELD SYSTEMS INCORPORATED 发明人 SLATER, DAN
分类号 G01B9/02;G01B11/26;(IPC1-7):G01B9/02 主分类号 G01B9/02
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