发明名称 Feinstruktur-Herstellungsverfahren.
摘要 Provided is a method for forming fine pattern free from shear of pattern caused by charging and high in dry etch resistance by using a high molecular organic film containing an organometallic complex or a metallic salt in single-layer or multi-layer resist process and treating the surface of this film with a reducing agent to form a metallic layer on the surface.
申请公布号 DE68918177(T2) 申请公布日期 1995.04.13
申请号 DE1989618177T 申请日期 1989.06.29
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD., KADOMA, OSAKA, JP 发明人 HASHIMOTO, KAZUHIKO, MORIGUCHI-SHI, JP;KOIZUMI, TAICHI, OSAKA, JP;KAWAKITA, KENJI, NEYAGAWA-SHI, JP;NOMURA, NOBORU, KYOTO, JP
分类号 G03F7/105;G03F1/68;G03F1/80;G03F7/004;G03F7/039;G03F7/09;G03F7/11;G03F7/26;G03F7/38;G03F7/40;H01L21/027;H01L21/30 主分类号 G03F7/105
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