发明名称 Semiconductor device having a deep impurity level for high temperature range operation.
摘要 <p>A semiconductor device has a structure in which doped layers and undoped layers are alternately stacked and is constituted by (a) a semi-insulating substrate, (b) undoped layers consisting of a substantially undoped diamond material, and (c) thin doped layers formed between the undoped layers and consisting of a diamond material doped with B as an impurity. Stable operation characteristics can be obtained within a temperature range from room temperature to a high temperature while a semiconductor material having a deep impurity level is used. &lt;IMAGE&gt;</p>
申请公布号 EP0646970(A2) 申请公布日期 1995.04.05
申请号 EP19940114876 申请日期 1994.09.21
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 NISHIBAYASHI, YOSHIKI, C/O ITAMI WORKS;SHIKATA, SHIN-ICHI, C/O ITAMI WORKS;FUJIMORI, NAOJI, C/O ITAMI WORKS;KOBAYASHI, TAKESHI
分类号 C30B29/04;H01L29/12;H01L29/15;H01L29/16;H01L29/167;H01L29/207;H01L29/267;(IPC1-7):H01L29/167;H01L29/227 主分类号 C30B29/04
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