发明名称 POLISHING DEVICE
摘要 PURPOSE:To provide uniform polishing further with small damage, in a polishing device for flattening a surface of semiconductor wafer or the like formed with a coating film. CONSTITUTION:A disk 13 and a weight 15 are mounted on an intermediate part of a lever 14, having a supporting point in one end part, and on the other end part respectively, to fix a magnet 18 to a lower part of the weight 15, and an electromagnet 19 is arranged adjacent to the lower of the magnet 18. A workpiece polished object (wafer) 1 is mounted on a lower surface of the disk 13, to polish the wafer pressed to a rotating polishing cloth 12. Here when electrified the electromagnet 19, attractive or repulsive force is generated between the magnet 18 and the electromagnet 19, and this force is overlapped with gravitational force of the weight 15, to adjust a polishing pressure. The polishing pressure can be controlled by an electrification current of the electromagnet 19.
申请公布号 JPH0788754(A) 申请公布日期 1995.04.04
申请号 JP19930232706 申请日期 1993.09.20
申请人 FUJITSU LTD 发明人 ARIMOTO YOSHIHIRO;HORIE HIROSHI;SUGIMOTO FUMITOSHI;KISHII SADAHIRO
分类号 B24B29/00;H01L21/304;(IPC1-7):B24B29/00 主分类号 B24B29/00
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