发明名称 Semiconductor bond pad structure and method
摘要 A method for forming an improved bonding pad structure. A bond pad structure is formed by depositing a barrier layer over an underlying region of a semiconductor device, and then depositing a first conductive layer over the barrier layer. The barrier layer and conductive layer are then patterned and etched to define a conductive region. In a preferred embodiment, the conductive region is formed in the shape of a grid. A second conductive layer is deposited over the conductive region and a portion of the exposed underlying region. The second conductive layer makes a good adhesive contact with the underlying region, thus preventing bond pad lift off.
申请公布号 US5403777(A) 申请公布日期 1995.04.04
申请号 US19940182845 申请日期 1994.01.14
申请人 SGS-THOMSON MICROELECTRONICS, INC. 发明人 BRYANT, FRANK R.;CHEN, FUSEN E.
分类号 H01L21/60;H01L23/485;(IPC1-7):H01L21/00;H01L21/44 主分类号 H01L21/60
代理机构 代理人
主权项
地址