发明名称 Measuring device and measuring method of implant structure
摘要 In a measuring technique used to restore a tooth with an employment of an implant structure, it is desirable to precisely determine the direction and position of bonding points in which a prosthesis is attached to the implant structure at the time of curing the tooth by of the implant structure. Upon precisely measuring the direction and position of bonding points in which a prosthesis is attached to the implant structure, measurement points are provided with the bonding points, and are taken a picture by a camera. In the picture thus taken, shape and position of the measurement points are measured by an image processor device by way of illustration so as to measure the positional relationship of the bonding points of the implant structure which is embedded in a human jaw.
申请公布号 US5401170(A) 申请公布日期 1995.03.28
申请号 US19930156908 申请日期 1993.11.24
申请人 KABUSHIKI KAISHA EGAWA 发明人 NONOMURA, YUUSUKE
分类号 A61C8/00;A61C19/04;(IPC1-7):A61C8/00;A61C5/00;A61C5/10 主分类号 A61C8/00
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