发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING MULTI-LAYER METAL WIRING STRUCTURE |
摘要 |
The method includes the steps of depositing a first metal layer (12), an etching stopper layer (13), and a connection metal layer (14) on a Si substrate (11) to form a pattern photoresist film (15) thereon, forming a pattern pillar (16) thereon by a photolithography and an ion etching methods, forming a first metal layer pattern (17), depositing an inter layered insulating film (18) thereon, mechanically and chemically flattening the layer (18) to etch-back the residual film (18), and depositing and patterning a second metal layer thereon to form a second metal layer pattern (21), thereby using a local flattening process and an Al pillar to reduce the step coverage.
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申请公布号 |
KR950002953(B1) |
申请公布日期 |
1995.03.28 |
申请号 |
KR19920009979 |
申请日期 |
1992.06.09 |
申请人 |
KOREA TELCOMMUNICATIONS CORP.;KOREA ELECTRONICS & TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
YUN, YONG - SON;LEE, DAE - U;MO, SUNG - KI;KIM, BO - U |
分类号 |
H01L21/768;(IPC1-7):H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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