发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE USING MULTI-LAYER METAL WIRING STRUCTURE
摘要 The method includes the steps of depositing a first metal layer (12), an etching stopper layer (13), and a connection metal layer (14) on a Si substrate (11) to form a pattern photoresist film (15) thereon, forming a pattern pillar (16) thereon by a photolithography and an ion etching methods, forming a first metal layer pattern (17), depositing an inter layered insulating film (18) thereon, mechanically and chemically flattening the layer (18) to etch-back the residual film (18), and depositing and patterning a second metal layer thereon to form a second metal layer pattern (21), thereby using a local flattening process and an Al pillar to reduce the step coverage.
申请公布号 KR950002953(B1) 申请公布日期 1995.03.28
申请号 KR19920009979 申请日期 1992.06.09
申请人 KOREA TELCOMMUNICATIONS CORP.;KOREA ELECTRONICS & TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 YUN, YONG - SON;LEE, DAE - U;MO, SUNG - KI;KIM, BO - U
分类号 H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L21/768
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