SCAN TEST CIRCUIT USING FAST TRANSMISSION GATE SWITCH

摘要

A fast transmission, integrated circuit switching device responsive to at least one external on/off control signal, and including a first input/output node, and a second input/output node, the switching device operative to pass or block the bidirectional transmission of external data signals between the first node and the second node, the switching device comprising a bidirectional field-effect transistor; a first scan cell; and a second scan cell; whereby input and output data signals of the switching device may be sensed and stored.