发明名称 |
A MULTIPLE ALLOY OHMIC CONTACT FOR A SEMICONDUCTOR DEVICE |
摘要 |
A protruding ohmic contact on a P type or N type semiconductor region is made by depositing an alloy of gold and a conductivity type impurity on the P type or N type region, which is heated up to a eutectic temperature of gold and the semiconductor material and thereafter depositing silver on the alloy contact; the conductivity type impurity used is such as produces the same conductivity type as that of the semiconductor region. |
申请公布号 |
US3686698(A) |
申请公布日期 |
1972.08.29 |
申请号 |
USD3686698 |
申请日期 |
1970.12.24 |
申请人 |
HITACHI LTD. |
发明人 |
KENJI AKEYAMA;NORIMASA MIYAMOTO |
分类号 |
H01L21/00;H01L23/532;H01L29/00;(IPC1-7):H01L3/00;H01L5/00 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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